1: \begin{abstract}

2: Learning with few labeled data is a key challenge for visual recognition, as deep neural networks tend to overfit using a few samples only.

3: One of the Few-shot learning methods called metric learning addresses this challenge by first learning a deep distance metric to determine whether a pair of images belong to the same category, then applying the trained metric to instances from other test set with limited labels.

4: This method makes the most of the few samples and limits the overfitting effectively.

5: However, extant metric networks usually employ Linear classifiers or Convolutional neural networks (CNN) that are not precise enough to globally capture the subtle differences between vectors.

6: In this paper, we propose a novel approach named Bi-attention network to compare the instances,

7: which can measure the similarity between embeddings of instances precisely, globally and efficiently.

8: We verify the effectiveness of our model on two benchmarks.

9: Experiments show that our approach achieved improved accuracy and convergence speed over baseline models.

10: \end{abstract}

11: