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8: \begin{document}
9:
10: \title{THz emission from ultrafast optical orientation}
11: \author{F. Nastos}
12: \affiliation{Department of Physics and Institute for Optical
13: Sciences, University of Toronto, 60 St. George Street, Toronto,
14: Ontario, Canada M5S 1A7}
15: \author{R. W. Newson}
16: \affiliation{Department of Physics and Institute for Optical
17: Sciences, University of Toronto, 60 St. George Street, Toronto,
18: Ontario, Canada M5S 1A7}
19: \author{J. H{\"u}bner}
20: \affiliation{Institute for Solid State Physics, University of
21: Hannover, Appelstr. 2, 30167 Hannover, Hannover, Germany}
22: \author{J. E. Sipe}
23: \affiliation{Department of Physics and Institute for Optical
24: Sciences, University of Toronto, 60 St. George Street, Toronto,
25: Ontario, Canada M5S 1A7}
26: \author{H. M. van Driel}
27: \affiliation{Department of Physics and Institute for Optical
28: Sciences, University of Toronto, 60 St. George Street, Toronto,
29: Ontario, Canada M5S 1A7}
30:
31: \begin{abstract}
32: We show both theoretically and experimentally that the magnetization
33: density accompanying ultrafast excitation of a semiconductor with
34: circular polarized light varies rapidly enough to produce a
35: detectable THz field.
36: \end{abstract}
37:
38: \maketitle
39:
40: A host of recent fundamental studies on the behavior of spins in
41: semiconductors have been motivated by the idea of using the spin
42: degree of freedom in information processing, the goal of a field
43: that has come to be known as \textit{spintronics}. Central to many
44: of these investigations has been the optical injection of spin
45: polarized electrons and holes into the band structure of a
46: semiconductor. These spin polarized carriers are then available to
47: be dragged by a bias voltage, for example, to regions of interest in
48: any proposed device structure. Such optical injection of spin
49: polarized carriers, also called \textit{optical orientation}, can be
50: effected by the absorption of circularly polarized light
51: \cite{DyakanovPerel,ZuticRMP04}, which takes advantage of the
52: selection rules to populate particular angular momentum states of
53: the band structure.
54:
55: In the analysis of most of these experiments it is assumed that the
56: holes can be neglected, because in bulk semiconductors the hole spin
57: lifetimes are typically much shorter than the electron spin
58: lifetimes. This makes it difficult, if not impossible, to measure
59: the optical orientation of hole spins in bulk semiconductors using
60: usual techniques employed to study electron spin orientation.
61: However, Hilton and Tang \cite{HiltonPRL02} recently showed that
62: pump-probe techniques could be used to probe the hole spin dynamics
63: in bulk GaAs. They found a time of $\tau_h = 110\,\text{fs}$ for
64: the hole spin relaxation time, which has spurred theoretical
65: investigations \cite{YuPRB05}. All such techniques measure optical
66: orientation {\em indirectly} by monitoring, after excitation, the
67: population in various bands, or its effect on luminescence or
68: Faraday rotation \cite{OestrichSST17,AwschalomPT52}.
69:
70: In this manuscript we present an approach for the \textit{direct}
71: measurement and study of ultrafast optical orientation. While we
72: focus on GaAs, the technique is applicable to a wide range of
73: semiconductors. It relies on the magnetization that accompanies the
74: injected spin density in optical orientation: Under ultrafast
75: excitation this magnetization varies rapidly over a sub-picosecond
76: timescale, and radiates in the terahertz (THz) regime. Such
77: radiation has already been used to study a host of other ultrafast
78: processes
79: \cite{BeaurepaireAPL04,SchmuttenmaerCR04,JohnstonPRB02,CoteAPL02},
80: and we show here that detailed measurement and analysis of the
81: emitted THz electric field trace can be used to study the electron
82: and hole spin dynamics.
83:
84: To estimate the THz field strength radiated from ultrafast optical
85: orientation, we compare the injected magnetization source $M(t)$ in
86: optical orientation to the injected polarization source $P(t)$ in
87: the shift current (also called the intrinsic photovoltaic effect
88: \cite{vonBaltzPRB81}). When a semiconductor is excited by photons
89: with energies above the band gap, electrons and holes are injected
90: at a rate that closely follows the temporal pulse profile
91: $\mathcal{I}(\mathbf{r},t)$, which is the intensity profile of the
92: laser pulse in the sample. The carrier density injection rate
93: $\dot{n}$ is given by $\dot{n}(\mathbf{r},t)=\xi_\omega
94: \mathcal{I}(\mathbf{r},t)$, where $\omega$ refers to the carrier
95: frequency of the laser, and $\xi_\omega$ is proportional to the
96: absorption coefficient. The spatial coordinate $\mathbf{r}$ accounts
97: for the variation from the exponential decay into the surface, and
98: the variation in intensity across the spot-size. The polarization
99: and magnetization sources we consider both arise from the carrier
100: injection, although they have different symmetry characteristics and
101: underlying microscopic origins.
102:
103: In III-V semiconductors, the shift current appears for excitation by
104: certain {\em linear} polarizations of the field
105: \cite{noteAboutPGEffect}. In this effect the center of charge of
106: the carriers moves as the carriers are promoted from the valence
107: band to the conduction band, and a net current directly results,
108: \begin{equation}
109: \dot{P}_{\text{inj}}(t) = p\dot{n}(\mathbf{r},t), \label{pdot}
110: \end{equation}
111: where $p=ed$ is the average injected dipole moment per carrier.
112: Here, $e$ is the electron charge and the displacement $d$ is on the
113: order of a Bohr radius $a_\text{B}$. Detailed calculations show
114: that for GaAs under excitation with linear polarized light along
115: [110] this distance $d$ is very close to the GaAs bond length,
116: $d=2.54\,a_\text{B}$ \cite{NastosPRB06}. Since the polarization
117: $P_{\text{inj}}(t)$ rises on a subpicosecond time-scale, it radiates
118: in the THz regime \cite{neglectOR}. However, the polarization
119: survives for much longer than a picosecond, and so its decay is not
120: expected to radiate in the THz regime. Thus for the polarization
121: that contributes to the far field radiation we have $\ddot{P}(t) =
122: \ddot{P}_{\text{inj}}(t)$.
123:
124: Optical orientation arises from {\em circularly} polarized
125: excitation of carriers near the band edge. Because of spin-orbit
126: splitting these carriers can have a net spin polarization, and
127: accompanying this spin density is a magnetization density
128: $M(\mathbf{r},t)$. For optically injected electrons, close to the
129: conduction band edge, the injected magnetization density is given by
130: \begin{equation}
131: \dot{M}_{e,\text{inj}}(\mathbf{r},t) = \bar\mu_e
132: \dot{n}(\mathbf{r},t), \label{mdot}
133: \end{equation}
134: where $\bar{\mu}_e$ is the mean magnetic moment of an injected
135: electron. Unlike for free electrons -- where the magnetic moment of
136: an electron is simply $\mu = g\mu_{\text B} s/\hbar$, where
137: $\mu_{\text B}$ is the Bohr magneton, $s=\hbar/2$, and $g$ is the
138: free electron $g$-factor, $g=2.0023$ -- the average magnetic moment
139: of an injected electrons can be written as $\bar\mu_e = g_e^\ast
140: \mu_{\text B} S / \hbar$, where $g_e^\ast$ is an effective
141: $g$-factor of an electron, and $S$ is the injected degree of spin
142: polarization in units of $\hbar/2$. The effective $g$-factor can be
143: calculated from Roth's expression for the magnetic moment of a Bloch
144: state in the $n$-th band~\cite{RothPR60},
145: \begin{equation}
146: \mu_n^z = - \frac{g \mu_\text{B} \sigma^z_n}{2}
147: -\frac{2}{mi}\sum_{s\ne n}
148: \frac{p^x_{ns}p^y_{sn}-p^y_{ns}p^x_{sn}}{\epsilon_{n}-\epsilon_{s}},
149: \label{Roth}
150: \end{equation}
151: and defining the effective $g$-factor {\it via} $g_e^\ast =
152: -2\mu_n/\mu_\text{B}$. In Eq.~\eqref{Roth}, $\sigma^z_n$ is the
153: expectation value of the Pauli spin matrix in the $n$-th band,
154: $p^x_{ns}$ is the $x$ component of the momentum matrix element
155: between the bands $n$ and $s$, and $\epsilon_n$ is the energy of the
156: $n$-th band. The $z$ direction is the direction along which the
157: magnetization is aligned. The appearance of $\sigma^z_n$ in the
158: first term is required to generalize the more common $g$-factor
159: expression \cite{ChadiPRB76} beyond $j=1/2$ states. For optically
160: injected electrons in GaAs, close to the conduction band edge,
161: $g_e^\ast$ is $-0.44$ at low temperatures~\cite{HermannPRB77}.
162:
163: This magnetization density $M_e(t)$ will vary on an ultrafast
164: time-scale with the laser pulse, and it will radiate in the THz
165: regime. The radiation will be magnetic-dipole like, in contrast to
166: the electric-dipole like radiation from the shift current. Since
167: the lifetime of the injected spins is known to be on the order of
168: many picoseconds~\cite{ZuticRMP04}, their decay will not contribute
169: to the THz and we have
170: $\ddot{M}_e(\mathbf{r},t)=\ddot{M}_{e,\text{inj}}(\mathbf{r},t).$
171:
172: The far-field radiation from both magnetic and polarization sources
173: is dependent on the second derivatives of the sources, $\ddot{M}(t)$
174: and $\ddot{P}(t)$. A simple estimate of the radiation from just the
175: electron magnetization ${M}_{e}(t)$ can be made by comparing this
176: source to the polarization induced by the shift current. Since both
177: of these sources survive long enough that their decay profiles are
178: not expected to radiate in the THz regime, it is mainly the
179: generation (or turn on) of these sources that provides the THz
180: radiation. The ratio of the peak strengths for the magnetization
181: and polarization sources are directly comparable, since the
182: different Fresnel coefficients governing the transmission of
183: radiation for each type of source only determine the radiation
184: patterns. So to first order we can estimate the strength of the
185: magnetic radiation from the ratio $\ddot{M}_e(t) / \ddot{P}(t)$.
186: Using Eq.~(\ref{mdot}) and~(\ref{pdot}) gives
187: \begin{equation}
188: \frac{\ddot{M}_e}{\ddot{P}}= \frac{\bar\mu_e}{p} =
189: \frac{Sg_e^\ast\mu_{\text B}}{\hbar ed}=
190: \frac{(S/\frac{\hbar}{2})g_e^\ast}{4(d/a_\text{B})}\alpha,
191: \label{eq1}
192: \end{equation}
193: where $\alpha$ is the fine structure constant. In GaAs optical
194: orientation gives 50\% spin polarization ($S=0.5 \hbar/2$), so the
195: ratio $\ddot M_e/\ddot P$ is roughly $1.6\times 10^{-4}$. The THz
196: fields from the shift current have been measured to be about 1500
197: V/m, so an absolute sensitivity of about 0.2 V/m is needed to
198: measure the THz radiation from optical orientation of bulk GaAs
199: electrons alone. This requirement is experimentally challenging
200: \cite{LloydHughesPRB04} but would not be impossible. Note that this
201: is because the THz field amplitude, rather than the intensity, is
202: measured experimentally. Were the intensity measured, the signal
203: from the magnetization effect would be down from that of the shift
204: current by a factor of $(\ddot M_e/\ddot P)^{2}$.
205:
206: The relatively short lifetime of the holes, however, suggests that
207: the hole spins may radiate in the THz regime. Including the decay
208: of the hole spins, the magnetization of the holes follows
209: \begin{equation}
210: \dot{M}_h(\mathbf{r},t) = \dot{M}_{h,\text{inj}}(\mathbf{r},t) -
211: \frac{{M}_h(\mathbf{r},t)}{\tau_h},
212: \end{equation}
213: where $\dot{M}_{h,\text{inj}}$ is the hole injection rate
214: \begin{equation}
215: \dot{M}_{h,\text{inj}}(\mathbf{r},t)=\bar\mu_h\dot{n}(\mathbf{r},t),
216: \end{equation}
217: analogous to the electron injection rate, but here $\bar\mu_h$ is
218: the mean magnetic moment of the injected holes.
219:
220: On the one hand, the decay of the holes adds more temporal variation
221: to the magnetization, and enhances the THz signal; on the other
222: hand, since the decay lowers the overall magnitude of the
223: magnetization, it is expected to decrease the THz signal. To include
224: both effects, we have solved for the far-field radiation from an
225: injected magnetization using a Green function formalism tailored to
226: planar interfaces \cite{SipeJOSAB87}. We find that for pulse widths
227: of 100\,fs the effect of the hole spin decay
228: ($\tau_h=110\,\text{fs}$) is to decrease the peak THz radiation from
229: this source by roughly a factor of two. That is, the hole spins
230: decay fast enough so that the decay process will contribute the THz
231: radiation, but slow enough that the overall signal from it is not
232: washed out.
233:
234: Yet the relatively short lifetimes of holes, in bulk materials such
235: as GaAs, prevents the study of their dynamics by many other
236: techniques. Thus the hole $g$-factors, and their magnetic moments in
237: general, have been largely neglected in bulk materials. In GaAs
238: based nanostructures however, hole $g$-factors have been the subject
239: of much recent attention \cite{PryorPRL06}. It is typically found
240: that in those systems that the holes have a $g$-factor many times
241: larger than the electron $g$-factor. In this work however, we are
242: interested in the optically injected magnetic moments $\bar\mu_h$,
243: rather than the $g$-factors themselves. The average magnetic moment
244: $\bar\mu_h$ will depend on the details of the populations injected
245: into the heavy-hole and light-hole bands. We calculate directly the
246: injected hole magnetization into these states, but for easy
247: comparison to the electron magnetization, we quote our result as a
248: hole $g$-factor $\tilde{g}_h^\ast$ relative to the injected electron
249: spin density, so that
250: \begin{equation}
251: \bar\mu_h = \frac{ \tilde{g}_h^{\ast} \mu_{\text B} S}{\hbar}.
252: \end{equation}
253: The tilde is to emphasize that we are not defining the $g$-factor
254: relative to the hole spins. Following a similar approach as
255: in~\cite{BhatPRL05} we use Fermi's golden rule together with Roth's
256: formula Eq.~\eqref{Roth} for the magnetization, and use a 30-band
257: $\mathbf{k}\cdot\mathbf{p}$ band structure~\cite{RichardPRB04} to
258: evaluate $\dot{M}_{h,\text{inj}}$ directly. We find that
259: $\tilde{g}^{\ast}_h = 14.1$, which implies that the hole
260: magnetization injection is approximately 32 times larger than the
261: electron magnetization injection and clearly dominates
262: it~\cite{LDAgFactor}.
263:
264: Combining this with our calculations for the radiation emission
265: (following \cite{SipeJOSAB87}) we find that for GaAs the hole
266: radiation should be of the order $3\times 10^{-3}$, or about $1/300$
267: times the shift current radiation.
268:
269: Despite the relatively large expected signal from the the holes, the
270: ratio of THz emission from magnetization to shift current is still
271: small, and one must choose an experimental geometry which minimizes
272: the shift current. Differences in the spatial symmetry
273: characteristics of shift current and magnetization sources are
274: exploited to distinguish the weak magnetization source from the much
275: stronger shift current source.
276:
277: \begin{figure}
278: \includegraphics[scale=0.75]{expsetupa.eps} \\
279: \includegraphics[scale=0.75]{expsetupb.eps} \\
280: \caption{(color online) (a) Experimental setup. (b) Top view of
281: sample with epoxy hemisphere. PEM: photoelastic modulator, HWP:
282: half waveplate, QWP: quarter waveplate, PD: photodiode
283: \label{expsetup}}
284: \end{figure}
285:
286: Fig. \ref{expsetup} illustrates the experimental setup for observing
287: the transient THz radiation. An 80\,MHz Ti:sapphire oscillator
288: delivers 1\,nJ, 100\,fs pulses at 800\,nm. For this wavelength, the
289: injected kinetic energy of heavy (light) holes is 3.6\,meV
290: (9.5\,meV), much less than the 300\,meV needed to excite holes in
291: the spin-orbit split-off band. The pulses are split into a pump
292: beam for sample excitation and a probe beam to sample THz radiation
293: via electro-optic sampling. The pump beam is incident onto a
294: 100\,$\mu$m thick (110) GaAs sample with a spot diameter of
295: 25\,$\mu$m, producing a peak incident intensity of 500\,MW/cm$^2$
296: and a carrier density of $2\times 10^{18}\,\text{cm}^{-3}$ over an
297: absorption depth of about 1\,$\mu$m. Since the total magnetization
298: or electric polarization is determined by total number of carriers
299: excited, and not their density, there is no premium associated with
300: beam focusing. The emitted THz radiation emitted along the surface
301: normal direction from the sample back side is collected with a f =
302: 50\,mm, $90^\circ$ off-axis parabolic and focused with the same type
303: of mirror onto a $500\,\mu$m thick (110) ZnTe electro-optic sampling
304: crystal. The $800\,\text{nm}$ probe pulse is spatially overlapped
305: with the THz field inside the ZnTe crystal and temporally scanned.
306: The pump beam polarization is controlled by half- and quarter-wave
307: plates (QWP) and a photo-elastic modulator (PEM). The half-wave
308: plate (HWP) is oriented to provide light linearly polarized
309: 45$^\circ$ from the $\mathbf{\hat{s}}$ polarization vector (the
310: vertical). The PEM operates in quarter-wave mode and modulates the
311: polarization state at a frequency of 42\,kHz, enabling lock-in
312: detection techniques.
313:
314: A major difficulty in measuring the emitted THz is that the injected
315: magnetic dipoles are parallel to the laser beam propagation
316: direction. For normal incidence excitation, this injects magnetic
317: dipoles that are perpendicular to the surface. The component of the
318: emitted radiation {nearly} parallel to the surface is small, and so
319: there is little transmission. In the shift current effect however,
320: the polarization is parallel to the surface, and this allows the
321: radiated THz field to easily transmit through the surface. To
322: enhance the emission of THz from the ultrafast optical orientation
323: it is thus necessary to irradiate the sample at {a high angle of
324: incidence; we use} an angle of incidence of $55^\circ$, exciting
325: through an epoxy hemisphere (see Fig. \ref{expsetup}b), to give an
326: angle of refraction inside the GaAs, $\theta_R$, of about
327: $20^\circ$. Even for this small angle it follows from the Maxwell
328: {\it saltus} (boundary) conditions that the emitted THz radiation
329: mainly propagates in the direction of the surface normal, because
330: the induced electron-hole plasma is $< 1\,\mu\text{m}$ thick,
331:
332: We define $\beta$ as the angle between the QWP's fast axis and
333: $\mathbf{\hat{s}}$. The shift current and magnetization signals
334: both depend on $\beta$ in a characteristic and unique way, so we
335: focus on that variable to distinguish between the two THz sources.
336: If we define $\gamma$ as the angle between the [001] crystal axis
337: (lying in the plane of the sample) and $\mathbf{\hat{s}}$, the
338: internal THz field emitted by the two types of sources are given by
339: \begin{eqnarray}
340: \Delta E_{\text{THz}}^{\text{shift}} & = & C e d \cos{(\theta_R)}
341: (2 \sin{\gamma} - 3 \sin^3{\gamma}) \cos{(2 \beta)}, \\
342: \Delta E_{\text{THz}}^{\text{mag}} & = & C \mu_{\text{eff}}
343: \sin{(\theta_R)} \sin^2{(2 \beta)},
344: \end{eqnarray}
345: where the proportionality constant $C$ includes universal constants
346: and Fresnel reflection and transmission coefficients. The effective
347: magnetic moment $\mu_\text{eff}$ describes the sum of electron and
348: hole magnetic moments, although we expect it to be dominated by hole
349: term. It is evident that the shift current (magnetization) signal
350: is maximized (minimized) when $\beta = 0^\circ$ and minimized
351: (maximized) when $\beta = 45^\circ$. This is because when
352: $\cos(2\beta)=0$ ($\sin(2\beta)=0$), the light polarization is
353: modulating between $+45^\circ$ and $-45^\circ$ linear (right and
354: left circular) states. We choose $\gamma = 0.02\,\text{rad}$
355: ($1.2^\circ$), for which $2\sin\gamma -3\sin^3\gamma\approx
356: 2\gamma$, in order to provide a small shift current source with
357: which to compare the magnetization signal.
358:
359: Fig. \ref{expresults}a illustrates the expected variation of the THz
360: field strength from the shift and magnetization sources, taking the
361: ratio of the source strengths to be 0.015. Other possible sources
362: of THz radiation were neglected. Optical rectification is small
363: relative to the shift current effect above the band gap, and shares
364: the same symmetry dependence. Sources of THz radiation related to
365: Dember fields have no dependence on crystal orientation or pump
366: polarization. Fig. \ref{expresults}b shows results from
367: experimental measurements of the THz field strength as a function of
368: $\beta$. The THz field strength is defined as the peak-to-peak value
369: of the observed THz trace, although several other definitions of
370: signal strength were used and each resulted in a similar pattern as
371: a function of $\beta$.
372:
373: \begin{figure}
374: \includegraphics[scale=0.5]{expresults.eps}
375: \caption{(color online) (a) Simulation of THz signal vs QWP angle
376: $\beta$. red dashed: shift current signal, blue thin: magnetization
377: signal, black thick: total signal (b) Experimental results (points)
378: with Fourier series fit (curve) \label{expresults}}
379: \end{figure}
380:
381: The deviation of the expected sinusoidal pattern created by the
382: shift current alone is attributed to the signal from the
383: magnetization source. The “zero crossings” of the Fourier series
384: fit to the data of Fig. \ref{expresults}b are separated by more than
385: $90^\circ$. This behavior indicates the presence of an additional
386: THz source with a $\beta$-dependence as shown in Fig.
387: \ref{expresults}a. The difference between maximum and minimum signal
388: values recorded at $\beta=90^\circ$ and $0^\circ$ respectively was
389: $0.05\pm 0.14\,\mu$V. This difference would have had to be on the
390: order of $1\,\mu\text{V}$ to attribute the data's deviation to a
391: uniform vertical shift. Experimental data indicates that the
392: relative strengths of the magnetization and shift current sources
393: have a ratio 0.017, which is within a factor of six of the
394: theoretical value of the hole contribution. More work is required
395: to confirm that the offset in Fig.~\ref{expresults}b is mainly due
396: to the magnetization source. Given all the possible sources of
397: systematic error, we consider this extremely good agreement in the
398: first study of this effect.
399:
400: Increasing the THz emission from the spin injection can be achieved
401: in a few ways: The THz generation depends on the injection rate of
402: spin polarized carriers, and so using a shorter pulse will give a
403: larger injection rate and increase the THz signal. One could also
404: use materials with a larger $g$-factor. Materials with $g$-factors
405: near 50, such as InAs, have been reported \cite{RothPR59}. Finally,
406: some materials also allow for a higher degree of spin polarization
407: $S$ to be achieved; in strained GaAs or the II-VI wurtzite
408: materials, for example, optical orientation can give an almost 100\%
409: polarized electron spin population.
410:
411: In conclusion, we have investigated the possibility of measuring THz
412: radiation from the ultrafast optical orientation of electrons and
413: holes. This THz radiation is due to a rapidly-varying magnetic
414: source, and we have shown that it is large enough to be detected
415: against the more usual THz signal from electric current sources.
416: Measurements of the THz radiation from spin-injection can complement
417: the wide range of experiments on spin polarization decay already
418: existing in the literature, providing a direct measurement of the
419: injected spin dynamics of both electrons and holes in
420: semiconductors.
421:
422: We thank J. Prineas, C. Pryor, A. Bristow, M. Betz and J. Rioux for
423: useful discussions. Preliminary experimental work by Q. H. Wang is
424: also acknowledged. This work is supported by NSERC, Photonics
425: Research Ontario, and DARPA SpinS.
426:
427: \bibliographystyle{apsrev}
428: \bibliography{THz_biblio}
429:
430: \end{document}
431: