1: \begin{abstract} 

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3: Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using  existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor $f$ that has typical values of 4-20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with $f^4$ compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate.

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5: %, varying the detector geometry, probe convergence angle, defocus of the probe and sample tilt.

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8: % We show that in many cases this algorithm, called PRISM, can provide two or more orders of magnitude speed up over the multislice method with negligible error.

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10: \end{abstract}

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