1: \begin{abstract}

2: The contact process is studied on long-range connected networks 

3: in the presence of random transition rates by means

4: of a strong disorder renormalization group method and Monte Carlo

5: simulations. 

6: We focus on the case where the connection probability decays with the distance

7: $x$ as $p(x)\simeq\beta x^{-2}$ in one dimension. 

8: Here, the graph dimension of the network can be 

9: continuously tuned with $\beta$. 

10: The critical behavior of the model is found to be described 

11: by an infinite randomness fixed

12: point which manifests itself in logarithmic dynamical scaling. 

13: Estimates of the complete set of the critical exponents, which are found to vary with the

14: graph dimension, are provided by different methods. 

15: According to the results, the additional disorder of transition rates does not

16: alter the infinite randomness critical behavior induced by the disordered

17: topology of the underlying random network. 

18: This finding opens up the possibility of the application 

19: of an alternative tool, 

20: the strong disorder renormalization group method to dynamical processes 

21: on topologically disordered structures.  

22: As the random transverse-field Ising model falls into the same universality

23: class as the random contact process,  

24: the results can be directly transferred to that model 

25: defined on the same networks. 

26:    

27: 

28: \end{abstract}